HANHWA
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Characteristic
Productivity 12% up compared to our conventional model
4-8wafer handling capability(Manual loading-stud bump area: up to 195mm
Compact transduser, lessen the impact from radiation heatof bonding stage
Various safety measures, Wafer mapping softwaretraceability capability (option)
Eco design with phenomenally low air cosumption
Lowered temperature bonding(Track record: 50 degree C)
Outstanding position repeatability of +3um(3a)
Post-bond-inspection system is available(option
Semi-automatic 8“ wafer Stud Bump Bonder